An Empirical Comparison of Model Validation Techniques for Defect Prediction Models
Authors:
Chakkrit Tantithamthavorn
Shane McIntosh
Ahmed E. Hassan
Kenichi Matsumoto
Venue:
TSE
IEEE Transactions on Software Engineering, Vol. 43, No. 1, pp. 1-18, 2017
Year:
2017
Abstract: Defect prediction models help software quality assurance teams to allocate their limited resources to
the most defect-prone modules. Model validation techniques, such as $k$ -fold
cross-validation, use historical data to estimate how well a model will perform in the future. However,
little is known about how accurate the estimates of model validation techniques tend to be. In this paper,
we investigate the bias and variance of model validation techniques in the domain of defect prediction.
Analysis of 101 public defect datasets suggests that 77 percent of them are highly susceptible to producing
unstable results– - selecting an appropriate model validation technique is a critical experimental
design choice. Based on an analysis of 256 studies in the defect prediction literature, we select the 12
most commonly adopted model validation techniques for evaluation. Through a case study of 18 systems, we
find that single-repetition holdout validation tends to produce estimates with 46-229 percent more bias and
53-863 percent more variance than the top-ranked model validation techniques. On the other hand,
out-of-sample bootstrap validation yields the best balance between the bias and variance of estimates in the
context of our study. Therefore, we recommend that future defect prediction studies avoid single-repetition
holdout validation, and instead, use out-of-sample bootstrap validation.
BibTeX:
@article{chakkrittantithamthavorn2017aecomvtfdpm,
author = "Chakkrit Tantithamthavorn and Shane McIntosh and Ahmed E. Hassan and Kenichi Matsumoto",
title = "An Empirical Comparison of Model Validation Techniques for Defect Prediction Models",
year = "2017",
pages = "1-18",
journal = "IEEE Transactions on Software Engineering",
volume = "43",
number = "1"
}
Plain Text:
Chakkrit Tantithamthavorn, Shane McIntosh, Ahmed E. Hassan, and Kenichi Matsumoto, "An Empirical Comparison of Model Validation Techniques for Defect Prediction Models," IEEE Transactions on Software Engineering, pp. 1-18